Professor Yoosuf N. Picard Assistant Research Professor of Materials Science and Engineering Ph.D., University of Michigan Roberts Engineering Hall 144 Carnegie Mellon University Pittsburgh, PA 15213 Email: Phone: (412) 268-3044 Fax: (412) 268-3113

Biography

Professor Picard obtained a B.S. in Mechanical Engineering from Louisiana Tech University in 2001 and a Ph.D. in Materials Science and Engineering from the University of Michigan in 2006. During his graduate career, he was a Microsystems Engineering and Science Applications Fellow at Sandia National Laboratories where he researched focused ion beam applications as well as pulsed laser ignition phenomenon in energetic thin films. Following his doctoral research on materials modifications by femtosecond lasers, he was a postdoctoral research associate at the U.S. Naval Research Lab (NRL), where he conducted electron microscopy studies of GaN devices, SiC thin films, and metal-oxide nanowires. He was subsequently hired as a staff scientist at NRL to carry out electron microscopy studies of metal alloy surfaces and magnetic metal-oxide thin films. He joined the faculty at Carnegie Mellon University in 2009.

Research Interests

Transmission electron microscopy, scanning electron microscopy, electron channeling contrast imaging, electron backscatter diffraction, dislocation analysis in semiconducting materials and devices, structural analysis in nanoscale materials, atomic scale imaging/analysis of interfaces.

Recent Publications

Y.N. Picard, M.E. Twigg, J.D. Caldwell, C.R. Eddy, Jr., M.A. Mastro, and R.T. Holm, "Resolving the Burgers vector for individual GaN threading dislocations by electron channeling contrast imaging," Scripta Materialia 61 (2009) 773.

L. Mazeina, Y.N. Picard, J.D. Caldwell, and S.M. Prokes, “Synthesis and properties of vertically aligned SnO2 nanorods,” Journal of Crystal Growth 311 (2009) 3158.

L. Mazeina, Y.N. Picard, and S.M. Prokes, “Controlled growth of parallel oriented ZnO nanostructural arrays on Ga2O3 nanowires,” Crystal Growth and Design 9 (2009) 1164.

M.E. Twigg and Y.N. Picard, "Simulation and analysis of electron channeling contrast images of threading screw dislocations in 4H-SiC," Journal of Applied Physics 105 (2009) 093520.

Y.N. Picard and M.E. Twigg, “Diffraction contrast and Bragg reflection determination in forward scattered electron channeling contrast images of threading screw dislocations in 4H-SiC,” Journal of Applied Physics 104 (2008) 124906.

Y.N. Picard, J.D. Caldwell, M.E. Twigg, C.R. Eddy Jr, M.A. Mastro, R.L. Henry, R.T. Holm, P.G. Neudeck, A.J. Trunek, J.A. Powell, “Nondestructive analysis of threading dislocations in GaN by electron channeling contrast imaging,” Applied Physics Letters 91 (2007) 094106.